1. komponenta

Lecture type	Total
Lectures	20
Seminar	10

* Load is given in academic hour (1 academic hour = 45 minutes)

Scattering of X-rays by a free electron. Polarization. Scattering by several electrons and by atom. Crystal and reciprocal lattices. Diffraction by a small crystal. Laue equations. Structure factor for a Bragg diffraction maximum. Effect of temperature vibration on diffraction pattern. Integrated intensity for a small crystal and for a crystalline powder-polycrystal. Diffraction by a crystalline powder. Diffractometer recording of diffraction pattern and collecting of diffraction data. Instruments for high and low temperature, high pressure and controlled atmosphere. New trends in development of diffraction instruments. Synchrotron radiation. Diffraction of electrons and neutrons by a crystalline powder. Analysis of systematic and random errors in measurement of diffraction maximum position. Identification of a crystalline material, qualitative and quantitative phase analysis. Accurate measurement of unit-cell parameters. Study of order-disorder in a crystal lattice. Diffraction by a defect crystal. Broadening of diffraction maxima. Determination of pure diffraction profile. Selection of mathematical functions describing a diffraction profile. Crystallite size and lattice imperfections (strains). Faults in sequence of crystal-lattice plains. Study of solid solutions, phase transitions and phase diagrams. New methods in indexing of diffraction pattern of a polycrystal and solution of crystal structure. Strategies for structure solution from powder diffraction data. The original Rietveld method for structure refinement using the whole diffraction pattern of a polycrystal/powder and its further development. Scattering of X-rays in an amorphous material. Radial distribution function. Study of metallic glasses.

1. OBVEZNA LITERATURA:
   C. Giacovazzo et al.: Fundamentals of Crystallography, 3rd Ed., Oxford University Press, Oxford, 2011. (IUCr Texts on Crystallography).
   W. I. F. David et al.: Structure determination from Powder Diffraction Data, Oxford University Press, Oxford, 2006 (IUCr Monographs on Crystallography).
   R. L. Snyder et al.: Defect and Microstructure Analysis by Diffraction, Oxford University Press, Oxford, 2000 (IUCr Monographs on Crystallography.
   R. A. Young (ed.): The Rietveld Method, Oxford University Press, Oxford, 1995 (IUCr Monographs on Crystallography).
   H.-J. Güntherodt, H. Beck (eds.): Glassy Metals I, Springer-Verlag, Berlin, 1981.
   H. P. Klug, L. E. Alexander : X-Ray Diffraction Precedures, 2nd Ed., John Wiley, New York, 1974.
   B. E. Warren: X-Ray Diffraction (Dover Books on Physics), Dover Publications; Reprint edition, 1990.
2. DOPUNSKA LITERATURA:
   revijalni članci i znanstvene monografije

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